SCOPUS 정보 검색 플랫폼

Volumn 34, Issue 16, 2001, Pages 2489-2496

Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra

(4) Ruiz Perez J J a Gonzalez Leal J M b Minkov, D A c Marquez E b

a Real Instituto y Observatorio de la Armada (Spain)

b UNIVERSITY OF CÁDIZ (Spain)

c TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT EXTINCTION; LIGHT PROPAGATION; LIGHT REFLECTION; LIGHT TRANSMISSION; PHYSICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SPECTRUM ANALYSIS; SUBSTRATES; THERMAL EFFECTS; THICKNESS MEASUREMENT; THIN FILMS;

OPTICAL CONSTANTS;

DIELECTRIC FILMS;

EID: 0035928624 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/34/16/314 Document Type: Article

Times cited : (50)

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