Wide-field extended-resolution fluorescence microscopy with standing surface-plasmon-resonance waves

Optics Letters

Volumn 34, Issue 15, 2009, Pages 2366-2368

  Chung, Euiheon ^a,b   Kim, Yang Hyo ^a   Tang, Wai Teng ^c   Sheppard, Colin J R ^c   So, Peter T C ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b MASSACHUSETTS GENERAL HOSPITAL   (United States)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC WAVES; FLUORESCENCE; FLUORESCENCE MICROSCOPY; IMAGING TECHNIQUES; PLASMONS;

BACKGROUND NOISE REDUCTION; BIOMOLECULAR DETECTIONS; LATERAL RESOLUTION; NANO-SCALE IMAGING; NATURE OF LIGHT; OPTICAL IMAGING TECHNIQUE; SIGNAL ENHANCEMENT; SURFACE PLASMON RESONANCE IMAGING;

SURFACE PLASMON RESONANCE;

ARTICLE; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; FLUORESCENCE MICROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; MICROELECTROMECHANICAL SYSTEM; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SURFACE PLASMON RESONANCE;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICRO-ELECTRICAL-MECHANICAL SYSTEMS; MICROSCOPY, FLUORESCENCE; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SURFACE PLASMON RESONANCE;

EID: 68149164465     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.34.002366     Document Type: Article

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