Point defects along metallic atomic wires on vicinal Si surfaces: Si(5 5 7)-Au and Si(5 5 3)-Au

Surface Science

Volumn 603, Issue 16, 2009, Pages 2588-2593

  Kang, Pil Gyu ^a   Shin, Jin Sung ^a   Yeom, Han Woong ^a  

^a Yonsei University   (South Korea)

Author keywords

Gold; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Silicon; Surface defects

Indexed keywords

ADSORPTION OF WATER; ATOMIC STRUCTURE; ATOMIC WIRES; AU SURFACES; BAND GAPS; CHEMICAL CHARACTERISTIC; CHEMICAL ORIGIN; CONDUCTION CHANNEL; HIGH RESOLUTION; INDUCED DEFECTS; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; SCANNING TUNNELING SPECTROSCOPY; SI SURFACES; STEP EDGE; STM IMAGES; WATER ADSORPTION; WATER MOLECULE;

ADATOMS; ADSORPTION; ATOMIC SPECTROSCOPY; ATOMS; CRYSTAL ATOMIC STRUCTURE; DEWATERING; ELECTRONIC PROPERTIES; MOLECULES; NANOWIRES; OLIGOMERS; POINT DEFECTS; SCANNING; SCANNING TUNNELING MICROSCOPY; SILICON; SOIL CONSERVATION; WIND TUNNELS; WIRE;

SURFACE DEFECTS;

EID: 68149119245     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.06.012     Document Type: Article

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