Atomic ordering in TiO2 thin films studied by X-ray reflection spectroscopy

Physica Status Solidi (B) Basic Research

Volumn 246, Issue 7, 2009, Pages 1454-1458

  Filatova, Elena ^a   Taracheva, Elena ^a   Shevchenko, Galina ^a   Sokolov, Andrey ^a   Kozhevnikov, Igor ^b   Yulin, Sergey ^d   Schaefers, Franz ^c   Braun, Walter ^c  

^a ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^c HAHN MEITNER INSTITUT   (Germany)

^d FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67849133815     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200945069     Document Type: Article

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