TEM investigation of interfaces during cuprous island growth

Acta Materialia

Volumn 57, Issue 15, 2009, Pages 4432-4439

  Zhou, G W ^a  

^a State University of New York   (United States)

Author keywords

Copper; Interface; Oxidation; Transmission electron microscopy

Indexed keywords

COINCIDENCE LATTICES; COINCIDENCE SITE LATTICES; CU SUBSTRATE; CU(1 0 0); EPITAXIAL ORIENTATIONS; EPITAXIAL RELATIONSHIPS; GROWTH FEATURE; INTERFACE; INTERFACE ENERGY; ISLAND GROWTH; METAL OXIDE INTERFACE; METAL SUBSTRATE; MISFIT DISLOCATIONS; ORIENTATION RELATIONSHIP; OXIDE ISLANDS; TEM;

ELECTRON MICROSCOPES; EPITAXIAL GROWTH; GEOMETRY; LANTHANUM COMPOUNDS; OXIDATION; TRANSMISSION ELECTRON MICROSCOPY;

SUBSTRATES;

EID: 67849132129     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.06.005     Document Type: Article

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