Mechanisms for Sn whisker growth in rare earth-containing Pb-free solders

Acta Materialia

Volumn 57, Issue 15, 2009, Pages 4588-4599

  Dudek, M A ^a   Chawla, N ^a  

^a Arizona State University   (United States)

Author keywords

3 D materials science; Focused ion beam (FIB); Whiskers

Indexed keywords

3-D MATERIALS SCIENCE; DRIVING FORCES; FOCUSED ION BEAM (FIB); INTERMETALLIC PHASIS; NEEDLE-LIKE; OXIDE STRUCTURES; PB FREE SOLDERS; PB-FREE SOLDER ALLOYS; SERIAL SECTIONING; SN WHISKER; TRACE AMOUNTS; WATER-QUENCHED; WHISKER GROWTH; WHISKERS;

BRAZING; CERIUM; CERIUM COMPOUNDS; CRYSTAL WHISKERS; FOCUSED ION BEAMS; INTERMETALLICS; IONS; LEAD; LEAD ALLOYS; OXIDATION; PHASE SEPARATION; RARE EARTH ALLOYS; RARE EARTHS; SOLDERING ALLOYS; THREE DIMENSIONAL; TIN ALLOYS; TRACE ELEMENTS; WELDING;

TIN;

EID: 67849107971     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.06.031     Document Type: Article

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