Doubly enhanced spontaneous emission due to increased photon density of states at photonic band edge frequencies

Optics Express

Volumn 17, Issue 15, 2009, Pages 13168-13177

  Kuroda, Keiji ^a,c   Sawada, Tsutomu ^a   Kuroda, Takashi ^a   Watanabe, Kenji ^a   Sakoda, Kazuaki ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c KITASATO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EXCITATION; LIGHT VELOCITY; OXYGEN VACANCIES; PHOTONS; TANTALUM OXIDES;

DIELECTRIC MULTILAYERS; EMISSION FREQUENCY; EMISSION PROFILE; ENHANCED SPONTANEOUS EMISSION; EXCITATION FREQUENCY; LIGHT EMITTERS; PHOTON DENSITIES; PHOTONIC BAND EDGE;

SPONTANEOUS EMISSION;

OXYGEN; SILICON DIOXIDE; TANTALUM;

ALGORITHM; ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRON PROBE MICROANALYSIS; LIGHT; LUMINESCENCE; METHODOLOGY; PHOTOCHEMISTRY; PHOTON; SCANNING ELECTRON MICROSCOPY; STATISTICAL MODEL;

ALGORITHMS; CRYSTALLIZATION; ELECTRON PROBE MICROANALYSIS; LIGHT; LUMINESCENCE; MICROSCOPY, ELECTRON, SCANNING; MODELS, STATISTICAL; OXYGEN; PHOTOCHEMISTRY; PHOTONS; SILICON DIOXIDE; TANTALUM;

EID: 67749124271     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.013168     Document Type: Article

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