Reflectance calculations for a predictable quantum efficient detector

Metrologia

Volumn 46, Issue 4, 2009, Pages

  Sildoja, Meelis ^a   Manoocheri, Farshid ^a   Ikonen, Erkki ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED DETECTOR; INVERSION LAYER; LOW LEVEL; OPTICAL POWER; ORDER OF MAGNITUDE; OXIDE LAYER THICKNESS; SPECULAR REFLECTANCE; WAVELENGTH RANGES;

DETECTORS; PHOTODIODES; REFLECTION;

QUANTUM EFFICIENCY;

EID: 67650917465     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/46/4/S03     Document Type: Article

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