Chromatic two-photon excitation fluorescence imaging

Journal of Microscopy

Volumn 235, Issue 1, 2009, Pages 79-83

  Xu, Q ^a   Shi, K ^a   Yin, S ^a   Liu, Z ^a  

^a The Center for Nanotechnology Education and Utilization   (United States)

Author keywords

Chromatic axial scanning; Two photon fluorescence microscopy

Indexed keywords

FLUORESCENCE IMAGING; FLUORESCENCE MICROSCOPY; PHOTONS;

AXIAL POSITIONS; AXIAL SCANNING; AXIAL SCANNING METHOD; CHROMATIC ABERRATION; CHROMATIC AXIAL SCANNING; EXCITATION BEAMS; FLUORESCENT MICROSPHERES; FRESNEL LENS; TWO-PHOTON EXCITATION FLUORESCENCE IMAGING; TWO-PHOTON FLUORESCENCE MICROSCOPY;

ABERRATIONS;

MICROSPHERE;

ARTICLE; EXCITATION; FLUORESCENCE MICROSCOPY; LENS; NEUTRON RADIATION; PHOTON; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SPECTRAL SENSITIVITY;

EID: 67650815717     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03183.x     Document Type: Article

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