Scanningless depth-resolved microscopy

Optics Express

Volumn 13, Issue 5, 2005, Pages 1468-1476

  Oron, Dan ^a   Tal, Eran ^a   Silberberg, Yaron ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; IMAGING SYSTEMS; LASER BEAMS; LASERS; PHOTONS; SCANNING;

FLUORESCENCE MICROSCOPY; LASER-SCANNING MICROSCOPY; PIXELS; PULSED EXCITATION FIELD;

MICROSCOPIC EXAMINATION;

EID: 17444392148     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.001468     Document Type: Article

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