Hard X-ray photon-in photon-out spectroscopy

Catalysis Today

Volumn 145, Issue 3-4, 2009, Pages 294-299

  Glatzel, Pieter ^a   Sikora, Marcin ^a   Smolentsev, Grigory ^b   Fernández García, Marcos ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^c INSTITUTO DE CATÁLISIS Y PETROLEOQUÍMICA   (Spain)

Author keywords

Electronic structure; Emission spectroscopy; EXAFS; RIXS

Indexed keywords

ABSORPTION EDGES; BEAM LINES; CENTRAL ATOM; CORE-HOLE LIFETIME; CRYSTAL SPECTROMETER; ELECTRON CONFIGURATION; EMISSION DETECTION; EXAFS; EXAFS SPECTROSCOPY; EXPERIMENTAL SETUP; HARD X RAY; LOCAL COORDINATION; NONRESONANT; PERFECT CRYSTALS; RADIATIVE DECAY; RESONANT X-RAY EMISSION SPECTROSCOPIES; RIXS; SMALL ENERGY; SPECTROSCOPIC TECHNIQUE; SPLITTINGS; X-RAY EMISSION;

ABSORPTION; ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTROMAGNETIC WAVE EMISSION; ELECTRON-ELECTRON INTERACTIONS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ELECTRONS; EMISSION SPECTROSCOPY; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; ION BEAMS; PHOTOEXCITATION; PHOTONS; SPECTROMETRY; TRANSITION METAL COMPOUNDS; TRANSITION METALS; X RAY SCATTERING; X RAY SPECTROMETERS; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 67650720602     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cattod.2008.10.049     Document Type: Article

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