Strain and magnetic anisotropy of as-grown and annealed Fe films on c (4×4) reconstructed GaAs (001) surface

Journal of Applied Physics

Volumn 106, Issue 1, 2009, Pages

  Lu, J ^a   Meng, H J ^a   Deng, J J ^a   Xu, P F ^a   Chen, L ^a   Zhao, J H ^a   Jia, Q J ^b  

^a INSTITUTE OF SEMICONDUCTORS   (China)

^b INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

[110] DIRECTION; AS-GROWN; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; FE FILMS; GAAS(001); HIGH RESOLUTION; IN-PLANE; IN-PLANE STRAINS; IN-SITU ANNEALING; LATTICE EXPANSION; LOW TEMPERATURES; UNIAXIAL MAGNETIC ANISOTROPY;

CRYSTAL GROWTH; DIFFRACTION; EPITAXIAL FILMS; GALLIUM ALLOYS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HOLOGRAPHIC INTERFEROMETRY; INTERFACIAL ENERGY; METALLIC FILMS; SEMICONDUCTING GALLIUM;

MAGNETIC ANISOTROPY;

EID: 67650714420     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3159642     Document Type: Article

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