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Volumn , Issue , 2009, Pages 31-34

Accurate effective mobility extraction in SOI MOS transistors

Author keywords

[No Author keywords available]

Indexed keywords

C-V MEASUREMENT; CARRIER SCATTERING; DRAIN BIAS; EFFECTIVE MOBILITIES; MOS TRANSISTORS; MOSFETS; SOI-MOSFET;

EID: 67650685022     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ULIS.2009.4897532     Document Type: Conference Paper
Times cited : (5)

References (17)
  • 4
    • 34547268597 scopus 로고    scopus 로고
    • Ramos, J., Augendre, E., Kottantharayil, A. et al. Proc. Solid-State Integr.Circuit Technol.8, 72 (2006)
    • Ramos, J., Augendre, E., Kottantharayil, A. et al. Proc. Solid-State Integr.Circuit Technol.8, 72 (2006)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.