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Volumn , Issue , 2009, Pages 31-34
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Accurate effective mobility extraction in SOI MOS transistors
a a a a b b c |
Author keywords
[No Author keywords available]
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Indexed keywords
C-V MEASUREMENT;
CARRIER SCATTERING;
DRAIN BIAS;
EFFECTIVE MOBILITIES;
MOS TRANSISTORS;
MOSFETS;
SOI-MOSFET;
MOSFET DEVICES;
TRANSISTOR TRANSISTOR LOGIC CIRCUITS;
CARRIER MOBILITY;
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EID: 67650685022
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ULIS.2009.4897532 Document Type: Conference Paper |
Times cited : (5)
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References (17)
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