Quantum dots investigated with charge detection techniques

Solid State Communications

Volumn 149, Issue 35-36, 2009, Pages 1419-1426

  Ihn, Thomas ^a   Gustavsson, Simon ^a   Gasser, Urszula ^a   Küng, Bruno ^a   Müller, Thomas ^a   Schleser, Roland ^a   Sigrist, Martin ^a   Shorubalko, Ivan ^a   Leturcq, Renaud ^a   Ensslin, Klaus ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

A. Quantum dots; B. Charge detection; D. Quantum point contacts; D. Shot noise

Indexed keywords

A. QUANTUM DOTS; B. CHARGE DETECTION; CHARGE DETECTION; CHARGE DETECTORS; CURRENT LEVELS; D. QUANTUM POINT CONTACTS; D. SHOT NOISE; FULL COUNTING STATISTICS; FUTURE APPLICATIONS; MATERIAL SYSTEMS; PRECISE MEASUREMENTS; QUANTUM DOT; QUANTUM DOT CHARGE; QUANTUM DOT DEVICES; QUANTUM POINT CONTACT; QUANTUM-INFORMATION PROCESSING; SELF-INTERFERENCE; TIME-RESOLVED;

DATA PROCESSING; DETECTORS; OPTICAL WAVEGUIDES; POINT CONTACTS; PRASEODYMIUM COMPOUNDS; QUANTUM CHEMISTRY; QUANTUM OPTICS; SHOT NOISE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 67650568802     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.04.040     Document Type: Article

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