Probing the electronic stability of multiply charged anions: Sulfonated pyrene tri- and tetraanions

Journal of the American Chemical Society

Volumn 131, Issue 28, 2009, Pages 9836-9842

  Wang, Xue Bin ^a,b   Sergeeva, Alina P ^c   Xing, Xiao Peng ^a,b   Massaouti, Maria ^d   Karpuschkin, Tatjana ^d   Hampe, Oliver ^d,e   Boldyrev, Alexander I ^c   Kappes, Manfred M ^d,e   Wang, Lai Sheng ^a,b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c UTAH STATE UNIVERSITY   (United States)

^d KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^e UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATIONS; CHARGED SPECIES; DECAY PRODUCTS; DYNAMIC STABILITY; ELECTRON BINDING ENERGY; ELECTRONIC STABILITY; INTRAMOLECULAR COULOMB REPULSIONS; ION PAIRS; METASTABILITY; METASTABLE SPECIES; MULTIPLY CHARGED ANIONS; PENNING TRAP; POTENTIAL BARRIERS; RADICAL ANIONS; SPONTANEOUS DECAY; STABLE SPECIES; TETRAANIONS;

BINDING SITES; ELECTRONS; MASS SPECTROMETRY; NEGATIVE IONS; NUCLEAR ENERGY; PHOTOELECTRON SPECTROSCOPY; POTENTIAL ENERGY;

BINDING ENERGY;

POLYANION; PYRENE; SULFONIC ACID DERIVATIVE;

AB INITIO CALCULATION; ARTICLE; CROSS LINKING; ELECTRON; HALF LIFE TIME; ION PAIR EXTRACTION; MASS SPECTROMETRY; MOLECULAR STABILITY; SUBSTITUTION REACTION; SURFACE CHARGE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 67650504133     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja903615g     Document Type: Article

References (44)

1. Scheller, M. K.; Compton, R. N.; Cederbaum, L. S. Science 1995, 270, 1160.
2. Freeman, G. R.; March, N. H. J. Phys. Chem. 1996, 100, 4331.
3. Schauer, S. N.; Williams, P.; Compton, R. N. Phys. Rev. Lett. 1990, 65, 625.
4. Boldyrev, A. I.; Gutowski, M.; Simons, J. Acc. Chem. Res. 1996, 29, 497.
5. Dreuw, A.; Cederbaum, L. S. Chem. Rev. 2002, 102, 181.
6. Weikert, H. G.; Cederbaum, L. S.; Tarantelli, F.; Boldyrev, A. I. Z. Phys. D 1991, 18, 299.
7. Scheller, M. K.; Cederbaum, L. S. J. Chem. Phys. 1994, 100, 8934.
8. Boldyrev, A. I.; Simons, J. J. Chem. Phys. 1993, 98, 4745.
9. Zakrzewski, V. G.; Ortiz, J. V. J. Chem. Phys. 1995, 102, 294.
10. Gnaser, H.; Oechsner, H. Nucl. Instrum. Methods Phys. Res. B 1993, 82, 518.
11. Middleton, R.; Klein, J. Nucl. Instrum. Methods Phys. Res. B 1997, 123, 532.
12. Hettich, R. L.; Compton, R. N.; Rotchie, R. H. Phys. Rev. Lett. 1991, 67, 1242.
13. (a) Boldyrev, A. I.; Simons, J. J. Phys. Chem. 1994, 98, 2298.
14. (b) Simons, J.; Skurski, P.; Barrios, R. J. Am. Chem. Soc. 2000, 122, 11893.
15. Blades, A. T.; Kebarle, P. J. Am. Chem. Soc. 1994, 116, 10761.
16. Wang, X. B.; Ding, C. F.; Wang, L. S. Phys. Rev. Lett. 1998, 81, 3351.
17. Wang, L. S.; Ding, C. F.; Wang, X. B.; Nicholas, J. B. Phys. Rev. Lett. 1998, 81, 2667.
18. Wang, X. B.; Wang, L. S. Nature 1999, 400, 245.
19. Wang, L. S.; Wang, X. B. J. Phys. Chem. A 2000, 104, 1978.
20. Wang, X. B.; Yang, X.; Wang, L. S. Int. Rev. Phys. Chem. 2002, 21, 473.
21. Ehrler, O. T.; Weber, J. M.; Furche, F.; Kappes, M. M. Phys. Rev. Lett. 2003, 91, 113006.
22. Wang, X. B.; Wang, L. S. Annu. Rev. Phys. Chem. 2009, 60, 105.
23. Wang, X. B.; Wang, L. S. Phys. Rev. Lett. 1999, 83, 3402.
24. Wang, X. B.; Ferris, K.; Wang, L. S. J. Phys. Chem. A 2000, 104, 25.
25. Wang, X. B.; Ding, C. F.; Wang, L. S. Chem. Phys. Lett. 1999, 307, 391.
26. Weis, P.; Hampe, O.; Gilb, S.; Kappes, M. M. Chem. Phys. Lett. 2000, 321, 426.
27. Arnold, K.; Balaban, T. S.; Blom, M. N.; Ehrler, O. T.; Gilb, S.; Hampe, O.; van Lier, J. E.; Weber, M.; Kappes, M. M. J. Phys. Chem. A 2003, 107, 794.
28. Kordel, M.; Schooss, D.; Gilb, S.; Blom, M. N.; Hampe, O.; Kappes, M. M. J. Phys. Chem. A 2004, 108, 4830.
29. Ehrler, O. T.; Yang, J.-P.; Sugiharto, A. B.; Unterreiner, A. N.; Kappes, M. M. J. Chem. Phys. 2007, 127, 184301.
30. Yang, J.; Xing, X. P.; Wang, X. B.; Wang, L. S.; Sergeeva, A. P.; Boldyrev, A. I. J. Chem. Phys. 2008, 128, 091102.
31. Wang, X. B.; Wang, L. S. Rev. Sci. Instrum. 2008, 79, 073108.
32. Blom, M.; Hampe, O.; Gilb, S.; Weis, P.; Kappes, M. M. J. Chem. Phys. 2001, 115, 3690.
33. Becke, A. D. J. Chem. Phys. 1993, 98, 5648.
34. Vosko, S. H.; Wilk, L.; Nusair, M. Can. J. Phys 1980, 58, 1200.
35. Lee, C.; Yang, W.; Parr, R. G. Phys. Rev. B 1988, 37, 785.
36. Dunning, T. H., Jr. J. Chem. Phys. 1989, 90, 1007.
37. Woon, D. E.; Dunning, T. H., Jr. J. Chem. Phys. 1993, 98, 1358.
38. Frisch, M. J.; et al. Gaussian 03, Revision C.02; Gaussian, Inc.: Wallingford CT, 2004.
39. Schaftenaar, G. MOLDEN3.4; CAOS/CAMM Center: The Netherlands, 1998.
40. Concina, B.; Neumaier, M.; Hampe, O.; Kappes, M. M. J. Chem. Phys. 2008, 128, 134306.
41. Concina, B.; Neumaier, M.; Hampe, O.; Kappes, M. M. Int. J. Mass Spectrom. 2006, 252, 110.
42. Tian, Z.; Kass, S. R. J. Am. Chem. Soc. 2008, 130, 10842.
43. Tian, Z.; Wang, X. B.; Wang, L. S.; Kass, S. R. J. Am. Chem. Soc. 2009, 131, 1174.
44. Tian, Z.; Chan, B.; Sullivan, M. B.; Radom, L.; Kass, S. R. Proc. Natl. Acad. Sci. U.S.A. 2008, 105, 7647.