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Volumn 104, Issue 10, 2000, Pages 1978-1990

Probing Free Multiply Charged Anions Using Photodetachment Photoelectron Spectroscopy

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Indexed keywords


EID: 0000582489     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9940093     Document Type: Article
Times cited : (197)

References (153)
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    • in press
    • Wang, X. B.; Wang, L. S. Phys. Rev. Lett. 1999, 83, 3402; J. Am. Chem. Soc., in press.
    • J. Am. Chem. Soc.
  • 25
    • 0011743291 scopus 로고    scopus 로고
    • Multiply Charged Negative Ions
    • Esaulov, V., Ed.; Cambridge University Press: Cambridge, U.K.
    • Compton, R. N. Multiply Charged Negative Ions. In Negative Ions; Esaulov, V., Ed.; Cambridge University Press: Cambridge, U.K., 1996.
    • (1996) Negative Ions
    • Compton, R.N.1
  • 119
    • 85037504123 scopus 로고    scopus 로고
    • Private communication
    • Comptom, R. N. Private communication.
    • Comptom, R.N.1
  • 123
    • 0041911861 scopus 로고
    • Lerner, R. G., Trigg, G. L., Eds.; VCH: New York
    • D'Haennens, I. J. In Encyclopedia of Physics; Lerner, R. G., Trigg, G. L., Eds.; VCH: New York, 1991; p 1251.
    • (1991) Encyclopedia of Physics , pp. 1251
    • D'Haennens, I.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.