Photodetachment spectroscopy of a doubly charged anion: Direct observation of the repulsive coulomb barrier

Physical Review Letters

Volumn 81, Issue 16, 1998, Pages 3351-3354

  Wang, Xue Bin ^a,b   Ding, Chuan Fan ^a,b   Wang, Lai Sheng ^a,b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACIDS; BINDING ENERGY; ELECTRIC CHARGE; ELECTRIC CURRENTS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON ENERGY LEVELS; ELECTROSTATICS; MASS SPECTROMETRY; PHOTOELECTRON SPECTROSCOPY; PROBES; SPECTRUM ANALYSIS;

DOUBLY CHARGED ANION; ELECTRON AFFINITY; ELECTROSTATIC INTERACTIONS; PHOTODETACHMENT SPECTROSCOPY; REPULSIVE COULOMB BARRIER; SECOND DETACHMENT CHANNEL; SOLVATION EFFECTS;

IONS;

EID: 0032547625     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.81.3351     Document Type: Article

References (31)

1. M. K. Scheller, R. N. Compton, and L. S. Cederbaum: Science, 270, 1160 (1995).
2. R. N. Compton, in Photophysics and Photochemistry in the Vacuum Ultraviolet, S. P. McGlynn et al, (Reidal, Dordrecht, 1985);
3. G. R. Freeman and N. H. March: J. Phys. Chem., 100, 4331 (1996).
4. J. Kalcher and A. F. Sax: Chem. Rev., 94, 2291 (1994);
5. A. I. Boldyrev, M. Gutowski, and J. Simons: Acc. Chem. Res., 29, 497 (1996).
6. R. N. Compton et al: Phys. Rev. Lett., 78, 4367 (1997).
7. O. V. Boltalina et al: Phys. Rev. Lett., 80, 5101 (1998).
8. R. N. Compton, in “Negative Ions” (Ref.).
9. S. N. Schauer, P. Williams, and R. N. Compton: Phys. Rev. Lett., 65, 625 (1990).
10. A. T. Blades and P. Kebarle: J. Am. Chem. Soc., 116, 10 761 (1994);
11. A. T. Blades, J. S. Klassen, and P. Kebarle, J. Am. Chem. Soc., 117, 10 563 (1995);
12. A. T. Blades, Y. Ho, and P. Kebarle: J. Phys. Chem., 100, 2443 (1996).
13. R. L. Hettich, R. N. Compton, and R. H. Rotchie: Phys. Rev. Lett., 67, 1242 (1991);
14. P. A. Limbach et al: J. Am. Chem. Soc., 113, 6795 (1991);
15. G. Khairallah and J. B. Peel: J. Phys. Chem. A, 101, 6770 (1997).
16. C. Jin et al: Phys. Rev. Lett., 73, 2821 (1994).
17. D. Calabrese et al: J. Chem. Phys., 105, 2936 (1996);
18. D. Mathur et al: Chem. Phys. Lett., 277, 558 (1997).
19. P. Kruit and F. H. Read: J. Phys. E, 16, 313 (1983);
20. O. Cheshnovsky et al: Rev. Sci. Instrum., 58, 2131 (1987).
21. L. S. Wang, H. S. Cheng, and J. Fan: J. Chem. Phys., 102, 9480 (1995);
22. L. S. Wang and H. Wu, in Advances in Metal and Semiconductor Clusters, M. A. Duncan (JAI Press, Greenwich, 1998), Vol. 4, pp. 299–343.
23. M. Yamashita and J. B. Fenn: J. Phys. Chem., 88, 4451 4671 (1984);
24. J. B. Fenn et al: Science, 246, 64 (1989).
25. Biochemical and Biotechnological Applications of Electrospray Ionization Mass Spectrometry, A. P. Snyder (ACS, Washington, DC, 1995).
26. T. C. Lau et al: J. Chem. Soc. Chem. Commun., 1994, 1487 (1994);
27. T. C. Lau: J. Chem. Soc. Chem. Commun., 1995, 877 (1995).
28. Practical Aspects of Ion Trap Mass Spectrometry, R. E. March and J. F. J. Todd (CRC Press, New York, 1995), Vols. I–III.
29. H. Hotop and W. C. Lineberger: J. Phys. Chem. Ref. Data, 14, 731 (1985);
30. M. K. Gilles, M. L. Polak, and W. C. Lineberger: J. Chem. Phys., 96, 8012 (1992).
31. R. Eisberg and R. Resnick, Quantum Physics of Atoms, Molecules, Solids, Nuclei, and Particles (Wiley, New York, 1985), 2nd ed.