Low frequency noise evolution of AlGaN/GaN HEMT after 2000 hours of HTRB and HTO life tests

AIP Conference Proceedings

Volumn 1129, Issue , 2009, Pages 625-628

  Sury, Charlotte ^a   Curutchet, Amaud ^a   Malbert, Nathalie ^a   Labat, Nathalie ^a  

^a UNIVERSITÉ BORDEAUX 1   (France)

Author keywords

AlGaN GaN HEMT; HTRB and HTO life tests; Low frequency noise; Reliability

Indexed keywords

EID: 67650491656     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3140552     Document Type: Conference Paper

References (6)

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6. N. Malbert et al., Internal report, CARDYNAL ANR Research report (2008).