Neutron reflectometry: A tool to investigate diffusion processes in solids on the nanometer scale

Advanced Engineering Materials

Volumn 11, Issue 6, 2009, Pages 446-451

  Schmidt, Harald ^a   Hüger, Erwin ^a   Chakravarty, Sujoy ^a   Stahn, Jochen ^b   Gutberlet, Thomas ^b   Tietze, Ursula ^c   Lott, Dieter ^c  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b ETH ZURICH   (Switzerland)

^c INSTITUTE OF MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL METHODS; DIFFUSION EXPERIMENTS; DIFFUSION LENGTH; DIFFUSION PROCESS; DIFFUSIVITIES; KINETIC PROCESS; MICROSTRUCTURAL CHANGES; MODEL SYSTEM; NANO-METER SCALE; NANOCRYSTALLINE IRON; NANOCRYSTALLINE SOLIDS; NEUTRON REFLECTOMETRY; NONEQUILIBRIUM STATE; QUASI ELASTIC NEUTRON SCATTERING; RADIOTRACER METHOD; SELF-DIFFUSION; SHORT DIFFUSION LENGTHS; SINGLE-CRYSTALLINE;

AMORPHOUS SILICON; CHARACTERIZATION; GERMANIUM; GRAIN GROWTH; ISOTOPES; NANOCRYSTALLINE MATERIALS; NANOCRYSTALLINE SILICON; NEUTRON DIFFRACTION; NEUTRON REFLECTION; NUCLEAR MAGNETIC RESONANCE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; REFLECTION; REFLECTOMETERS; SECONDARY ION MASS SPECTROMETRY; SILICON NITRIDE;

DIFFUSION;

EID: 67650302634     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.200800325     Document Type: Article

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