SCOPUS 정보 검색 플랫폼

Volumn 263, Issue , 2007, Pages 51-56

Self-diffusion in covalent amorphous solids - A comparative study using neutron reflectometry and SIMS

Author keywords

Amorphous silicon nitride; Isotope multilayers; Neutron reflectometry; Secondary ion mass spectrometry; Self diffusion

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLIZATION; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; SILICON NITRIDE;

AMORPHOUS SILICON NITRIDE; ISOTOPE MULTILAYERS; NEUTRON REFLECTOMETRY (NR); SELF-DIFFUSION;

DIFFUSION;

EID: 34147189229 PISSN: 10120386 EISSN: 16629507 Source Type: Journal
DOI: 10.4028/3-908451-35-3.51 Document Type: Conference Paper

Times cited : (4)

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