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Volumn 355, Issue 28-30, 2009, Pages 1489-1495
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Optical properties of Ge-Se-Te wedge-shaped films by using only transmission spectra
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Author keywords
Band structure; Chalcogenides; III V semiconductors; Optical spectroscopy; Tellurites; X ray diffraction
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Indexed keywords
ABSORPTION COEFFICIENTS;
ANALYTICAL EXPRESSIONS;
CHEMICAL COMPOSITIONS;
COHESIVE ENERGIES;
DIRECT TRANSITION;
DISPERSION ENERGIES;
HOMOPOLAR BONDS;
III-V SEMICONDUCTORS;
NON-UNIFORM THICKNESS;
OPTICAL ABSORPTION;
OPTICAL BANDS;
OPTICAL SPECTROSCOPY;
OPTICAL TRANSMISSION SPECTRUM;
OSCILLATOR ENERGY;
TELLURITES;
THERMAL EVAPORATION METHOD;
TRANSMISSION SPECTRUMS;
WAVELENGTH RANGES;
ABSORPTION;
BAND STRUCTURE;
CHALCOGENIDES;
CHEMICAL BONDS;
DIFFRACTION;
DISPERSION (WAVES);
GERMANIUM;
LIGHT REFRACTION;
OPTICAL CONSTANTS;
REFRACTIVE INDEX;
REFRACTOMETERS;
SEMICONDUCTING SELENIUM COMPOUNDS;
THERMAL EVAPORATION;
THIN FILMS;
X RAY DIFFRACTION;
OPTICAL FILMS;
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EID: 67650230361
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2009.05.042 Document Type: Article |
Times cited : (57)
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References (36)
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