Compositional dependence of the optical constants of amorphous Ge xAs20Se80-x thin films

Journal of Physics D: Applied Physics

Volumn 41, Issue 21, 2008, Pages

  Dahshan, A ^a   Amer, H H ^b   Aly, K A ^c  

^a SUEZ CANAL UNIVERSITY   (Egypt)

^b NATIONAL CENTER FOR RADIATION RESEARCH AND TECHNOLOGY   (Egypt)

^c Al Azhar University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; AMORPHOUS FILMS; ARSENIC; GERMANIUM; LIGHT REFRACTION; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFRACTIVE INDEX; REFRACTOMETERS; SELENIUM; SEMICONDUCTING SELENIUM COMPOUNDS; THERMAL EVAPORATION; THIN FILMS;

BULK SAMPLES; COMPLEX INDEX OF REFRACTIONS; COMPOSITIONAL DEPENDENCES; EXTINCTION COEFFICIENTS; FUNDAMENTAL ABSORPTION EDGES; IMAGINARY PARTS; INTERFERENCE FRINGES; NORMAL INCIDENCES; OPTICAL ABSORPTION MEASUREMENTS; OPTICAL BANDS; SPECTRAL REGIONS;

OPTICAL FILMS;

EID: 58149306136     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/21/215401     Document Type: Article

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