Test structure to extract circuit models of nanostructures operating at high frequencies

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2009, Pages 36-38

  Madriz, Francisco R ^a   Jameson, John R ^a   Krishnan, Shoba ^a   Sun, Xuhui ^a   Yang, Cary Y ^a  

^a Department of Computer Science and Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT MODELS; ELECTRICAL TRANSPORT; HIGH FREQUENCY; HIGH FREQUENCY HF; NANO-SCALE SYSTEM; RC CIRCUITS; S-PARAMETERS; TEST STRUCTURE;

FREQUENCY RESPONSE; NANOSTRUCTURED MATERIALS; SCATTERING PARAMETERS;

TESTING;

EID: 67650122544     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMTS.2009.4814605     Document Type: Conference Paper

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