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Volumn 50, Issue 5, 2001, Pages 1307-1314

New theoretical analysis for the LRRM calibration technique for vector network analyzers

Author keywords

Calibration algorithms; Calibration standards; Calibration techniques; Network analyzer; On wafer calibration; Reference impedance; Self calibration

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; ELECTRIC NETWORK ANALYSIS; NUMERICAL ANALYSIS; VECTOR QUANTIZATION;

EID: 0035483584     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.963202     Document Type: Article
Times cited : (58)

References (14)
  • 14
    • 4243251726 scopus 로고    scopus 로고
    • Tècniques de caracterització de transistors de microones amb aplicació al seu modelatge lineal
    • Ph.D. (in Catalan and in Spanish), Univ. Politècnica de Catalunya, Barcelona, Spain, June
    • (1996)
    • Purroy, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.