A new method for microwave characterization of metallic single-walled carbon nanotubes

2008 8th IEEE Conference on Nanotechnology, IEEE-NANO

Volumn , Issue , 2008, Pages 228-229

  Chunrong, Song ^a   Zuqin, Liu ^b   Eres, Gyula ^b   Geohegan, David B ^b   Wang, Pingshan ^a  

^a Clemson University   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL MEASUREMENTS; LOW INTENSITIES; MICROWAVE CHARACTERIZATIONS; ON CHIPS; PARASITIC EFFECTS;

COMPUTATIONAL METHODS; MICROWAVES; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; SINGLE-WALLED CARBON NANOTUBES (SWCN);

CARBON NANOTUBES;

EID: 55349122567     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2008.74     Document Type: Conference Paper

References (7)

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