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Volumn 42, Issue 4, 2009, Pages

Measurement of transit time for femtosecond-laser-driven shock wave through aluminium films by ultrafast microscopy

Author keywords

[No Author keywords available]

Indexed keywords

FEMTOSECOND; FS-LASER; FULL WIDTH HALF MAXIMUM; LASER INTENSITIES; LASER-DRIVEN SHOCK WAVES; MICROSCOPY TECHNIQUE; PICOSECOND; SHOCK PRESSURE; SHOCK VELOCITIES; TIME-RESOLVED; TRANSIT TIME; ULTRA-FAST;

EID: 67650088868     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/4/045502     Document Type: Article
Times cited : (31)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.