Ultrafast interferometric microscopy for laser-driven shock wave characterization

Journal of Applied Physics

Volumn 92, Issue 7, 2002, Pages 3679-3682

  Gahagan, K T ^a   Moore, D S ^b   Funk, D J ^b   Reho, J H ^b   Rabie, R L ^b  

^a Corning Incorporated ^*  (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRIC MICROSCOPY; LASER-DRIVEN SHOCK WAVES; OUT-OF-PLANE; PROBE PULSE; SHOCK DYNAMICS; SHORT DURATIONS; SPATIAL EXTENT; SPATIAL RESOLUTION; SPECTRAL INTERFEROMETRY; TEMPORAL RESOLUTION; THIN METAL FILMS; TIME-RESOLVED; ULTRA-FAST;

IMAGE RESOLUTION; PROBES; SHOCK WAVES; TWO DIMENSIONAL;

INTERFEROMETRY;

EID: 18644379255     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1505976     Document Type: Article

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