Measurement of shock wave rise times in metal thin films

Physical Review Letters

Volumn 85, Issue 15, 2000, Pages 3205-3208

  Gahagan, K T ^a   Moore, D S ^a   Funk, David J ^a   Rabie, R L ^a   Buelow, S J ^a   Nicholson, J W ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; CRYSTAL LATTICES; INTERFEROMETRY; LASER APPLICATIONS; MECHANICAL VARIABLES MEASUREMENT; METALS; PRESSURE; REACTION KINETICS; SPECTRUM ANALYSIS; SURFACE PHENOMENA; THIN FILMS; VELOCITY;

FREE SURFACE VELOCITY; FREQUENCY DOMAIN INTERFEROMETRY; LATTICE SPACING; METAL THIN FILMS; SUBPICOSECOND TIME RESOLUTION;

SHOCK WAVES;

EID: 0034301122     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.3205     Document Type: Article

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