Terahertz transmission through p + porous silicon membranes

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 6, 2009, Pages 1273-1277

  Lo, Shu Zee A ^a   Rossi, Andrea M ^a,b   Murphy, Thomas E ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION COEFFICIENTS; ABSORPTION PEAKS; CRYSTALLINE SILICONS; EFFECTIVE RESISTIVITY; EXPERIMENTAL MEASUREMENTS; FAR INFRARED; FOUR-ORDER; OXIDIZED POROUS SILICON; SILICON MEMBRANES; SILICON SAMPLES; SPECTRAL TRANSMISSION; SPECTRAL VARIATION; SURROUNDING ENVIRONMENT; TERA HERTZ; TERAHERTZ TIME DOMAIN SPECTROSCOPY; TERAHERTZ TRANSMISSION; THERMAL OXIDATION;

ABSORPTION; CERAMIC CAPACITORS; DIELECTRIC PROPERTIES; HYDROGEN;

POROUS SILICON;

EID: 67650003336     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881073     Document Type: Article

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