Far-infrared dielectric constant of porous silicon layers measured by terahertz time-domain spectroscopy

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 6007-6010

  Labbe Lavigne S ^a   Barret, S ^b   Garet, F ^a   Duvillaret, L ^a   Coutaz, J L ^a  

^a UNIVERSITÉ DE SAVOIE   (France)

^b UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; PERMITTIVITY; POROSITY; REFRACTIVE INDEX; SPECTROSCOPY;

DRUDE THEORY; MAXWELL-GARNETT MODEL; TERAHERTZ TIME DOMAIN SPECTROSCOPY;

POROUS SILICON;

EID: 0032098640     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367467     Document Type: Article

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