Study of the dissolution of thin films of cerium oxide by using a GaPO 4 crystal microbalance

Analytical Chemistry

Volumn 81, Issue 13, 2009, Pages 5139-5145

  Jakab, Sandrine ^a,b   Picart, Sé Bastien ^a   Tribollet, Bernard ^b   Rousseau, Philippe ^b   Perrot, Hubert ^b   Gabrielli, Claude ^b  

^a DIF   (France)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BEFORE AND AFTER; CERIUM OXIDES; COPPER DEPOSITION; CRYSTAL MICROBALANCE; DISSOLUTION RATES; GALVANOSTATIC; GRAVIMETRIC MEASUREMENTS; HIGH POTENTIAL; HIGH TEMPERATURE; HIGH TEMPERATURE TREATMENTS; HIGH-TEMPERATURE TREATMENT; HYDROXIDE PRECURSOR; MICROBALANCE; PIEZOELECTRIC PROPERTY; RATE DETERMINING STEP; REDUCTION REACTION; ROOM TEMPERATURE;

CERIUM; CERIUM COMPOUNDS; HYDROGEN; HYDROGEN PEROXIDE; OXIDE FILMS; OXIDE MINERALS; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; THIN FILMS;

DISSOLUTION;

CERIUM OXIDE; COPPER; GALLIUM; HYDROGEN PEROXIDE; HYDROXIDE;

ACCURACY; ARTICLE; CRYSTAL; DISSOLUTION; FILM; GRAVIMETRY; HIGH TEMPERATURE; PIEZOELECTRICITY; PRECURSOR; QUARTZ CRYSTAL MICROBALANCE; REDUCTION; ROOM TEMPERATURE;

EID: 67649976791     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac900826u     Document Type: Article

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