In situ atomic force microscopy studies of the deposition of cerium oxide films on regularly corrugated surfaces

Journal of the Electrochemical Society

Volumn 146, Issue 5, 1999, Pages 1809-1815

  Li, Feng Bin ^a,b   Thompson, G E ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL ELECTRODES; ELECTRODEPOSITION; ELECTROLYTES; GOLD; GRAIN GROWTH; NUCLEATION; REACTION KINETICS; SUBSTRATES;

CERIUM OXIDE;

CERIUM COMPOUNDS;

EID: 0032638835     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1391848     Document Type: Article

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