SCOPUS 정보 검색 플랫폼

Volumn 105, Issue 11, 2009, Pages

Structural characterization and magnetic profile of annealed CoFeBMgO multilayers

(9) Vadala M a Zhernenkov, K a,b Wolff, M a,b Toperverg, B P a,c Westerholt, K a Zabel, H a Wisniowski, P d Cardoso, S d Freitas, P P d

a RUHR UNIVERSITY BOCHUM (Germany)

b INSTITUT LAUE LANGEVIN (France)

c PETERSBURG NUCLEAR PHYSICS INSTITUTE (Russian Federation)

d INESC (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS COFEB; ANNEALING TEMPERATURES; MAGNETIC PROFILES; MAGNETIC TUNNEL JUNCTION; MGO BARRIER; MULTILAYER STACKS; OVEROXIDATION; POLARIZED NEUTRON REFLECTIVITY; PREPARATION METHOD; PRODUCTION METHODS; RECRYSTALLIZATION TEMPERATURES; ROOM TEMPERATURE; SCATTERING LENGTH DENSITY; STRUCTURAL CHARACTERIZATION; TUNNELING MAGNETORESISTANCE; X RAY REFLECTIVITY;

ANNEALING; COBALT COMPOUNDS; ELECTRIC RESISTANCE; MAGNETIC DEVICES; MAGNETIC FIELD EFFECTS; MAGNETIC MULTILAYERS; MAGNETORESISTANCE; POLYMER BLENDS; REFLECTION; SEMICONDUCTOR JUNCTIONS; WAVEGUIDE JUNCTIONS;

TUNNEL JUNCTIONS;

EID: 67649519735 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3139281 Document Type: Article

Times cited : (14)

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