Applications of Glancing Incidence X-Ray Analysis

X-Ray Spectrometry

Volumn 26, Issue 3, 1997, Pages 115-121

  Leenaers, A J G ^a   De Boer, D K G ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE-DEPENDENT; GLANCING INCIDENCE; GLANCING INCIDENCE X-RAY ANALYSIS; LAYERED MATERIAL; TECHNOLOGICAL APPLICATIONS; X RAY REFLECTIVITY; X-RAY FLUORESCENCE MEASUREMENT;

X RAY ANALYSIS;

EID: 0031510776     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199705)26:3<115::AID-XRS219>3.0.CO;2-Y     Document Type: Article

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