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Volumn 93, Issue 9, 2009, Pages 1630-1635

Physical understanding of the behavior of silver thick-film contacts on n-type silicon under annealing conditions

Author keywords

Contact resistance; Post metallization annealing; Scanning electron microscopy; Silicon solar cells; Spatially resolved series resistance

Indexed keywords

ANNEALING CONDITION; CONTACT INTERFACE; CURRENT FLOWS; HIGH EFFICIENCY; INDUSTRIAL ENVIRONMENTS; METALLIZATION; N TYPE SILICON; POST METALLIZATION ANNEALING; REAR SIDE; SCREEN-PRINTED; SEM; SPATIALLY RESOLVED SERIES RESISTANCE; THICK-FILM CONTACT;

EID: 67649401681     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.04.019     Document Type: Article
Times cited : (35)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.