Detailed analysis of annealing silver front side contacts on silicon solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Kontermann, S ^a   Grohe, A ^a   Preu, R ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; FILM METALLIZATION; HIGH TEMPERATURE; NITROGEN ATMOSPHERES; POST PROCESSING; QUALITY IMPROVEMENT; RESISTANCE MEASUREMENT; SILICON INTERFACE;

CONTACT RESISTANCE; METALLIZING; SCANNING ELECTRON MICROSCOPY; SILICON SOLAR CELLS; SILVER; THICK FILMS;

ANNEALING;

EID: 84879733853     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922788     Document Type: Conference Paper

References (11)

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