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Volumn 46, Issue 10, 1999, Pages 1970-1977

Understanding and implementation of rapid thermal technologies for high-efficiency silicon solar cells

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTALLINE MATERIALS; CURRENT DENSITY; DIFFUSION; ELECTRIC CONTACTS; ELECTRIC LAMPS; PASSIVATION; PHOTOVOLTAIC CELLS; RAPID THERMAL ANNEALING; SCREEN PRINTING; SEMICONDUCTING FILMS; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0033340775     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.791984     Document Type: Article
Times cited : (28)

References (14)
  • 7
    • 0015036776 scopus 로고    scopus 로고
    • The effects of alloying material on regrowth-layer structure in silicon power devices
    • The effects of alloying material on regrowth-layer structure in silicon power devices, J. Mater. Sei,vol. 6,pp. 189-199,1971.
    • J. Mater. Sei,vol. 6,pp. 189-199,1971.
  • 11
    • 0001188528 scopus 로고    scopus 로고
    • An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes
    • L. M. Terman.An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes, Solid-State Electron.,vol. 5,pp. 285-299,1962.
    • Solid-State Electron.,vol. 5,pp. 285-299,1962.
    • Terman, L.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.