Improved phase sensitivity in spectral domain phase microscopy using line-field illumination and self phase-referencing

Optics Express

Volumn 17, Issue 13, 2009, Pages 10681-10687

  Yaqoob, Zahid ^a   Choi, Wonshik ^a,b   Oh, Seungeun ^a   Lue, Niyom ^a   Park, Yongkeun ^a   Fang Yen, Christopher ^a   Dasari, Ramachandra R ^a   Badizadegan, Kamran ^a,c   Feld, Michael S ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Korea University   (South Korea)

^c MASSACHUSETTS GENERAL HOSPITAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELL MEMBRANES; COHERENT LIGHT; OPTICAL TOMOGRAPHY; STRAIN MEASUREMENT;

HIGH NUMERICAL APERTURES; MICROSCOPE OBJECTIVE; NANO-METER SCALE; PATH-LENGTH SENSITIVITY; PHASE SENSITIVITY; SPECTRAL DOMAIN OPTICAL COHERENCE TOMOGRAPHIES; SPECTRAL-DOMAIN PHASE MICROSCOPIES; TWO-DIMENSIONAL SURFACE;

MICROSCOPES;

ARTICLE; CELL MEMBRANE; EQUIPMENT DESIGN; HELA CELL; HUMAN; INSTRUMENTATION; LASER; METABOLISM; METHODOLOGY; MICROSCOPY; NERVE CELL; OPTICAL COHERENCE TOMOGRAPHY; OPTICS; PATHOLOGY; SPECTROPHOTOMETRY; SURFACE PROPERTY;

CELL MEMBRANE; EQUIPMENT DESIGN; HELA CELLS; HUMANS; LASERS; MICROSCOPY; NEURONS; OPTICS AND PHOTONICS; SPECTROPHOTOMETRY; SURFACE PROPERTIES; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 67649261936     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.010681     Document Type: Article

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