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Volumn 32, Issue 4, 2007, Pages 388-390
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Phase retrieval in low-coherence interferometric microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERFEROMETRIC MICROSCOPY;
PHASE MICROSCOPY;
PHASE RETRIEVAL;
QUANTITATIVE PHASE;
COHERENT LIGHT;
DOPPLER EFFECT;
ERROR COMPENSATION;
LIGHT MEASUREMENT;
PROBLEM SOLVING;
SPECTRUM ANALYSIS;
INTERFEROMETRY;
ALGORITHM;
ARTICLE;
COMPUTER ASSISTED DIAGNOSIS;
EVALUATION;
IMAGE ENHANCEMENT;
INTERFEROMETRY;
METHODOLOGY;
OPTICAL COHERENCE TOMOGRAPHY;
PHASE CONTRAST MICROSCOPY;
REPRODUCIBILITY;
SENSITIVITY AND SPECIFICITY;
THREE DIMENSIONAL IMAGING;
ALGORITHMS;
IMAGE ENHANCEMENT;
IMAGE INTERPRETATION, COMPUTER-ASSISTED;
IMAGING, THREE-DIMENSIONAL;
INTERFEROMETRY;
MICROSCOPY, INTERFERENCE;
REPRODUCIBILITY OF RESULTS;
SENSITIVITY AND SPECIFICITY;
TOMOGRAPHY, OPTICAL COHERENCE;
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EID: 33847610090
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.32.000388 Document Type: Article |
Times cited : (18)
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References (7)
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