Profilometry with line-field Fourier-domain interferometry

Optics Express

Volumn 13, Issue 3, 2005, Pages 695-701

  Endo, Takashi ^a   Yasuno, Yoshiaki ^a   Makita, Shuichi ^a   Itoh, Masahide ^a   Yatagai, Toyohiko ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CAMERAS; CHARGE COUPLED DEVICES; COHERENT LIGHT; FOURIER TRANSFORMS; IMAGING SYSTEMS; MATHEMATICAL MODELS; PROFILOMETRY;

FRINGE ANALYSIS; NYQUIST RESTRICTION; SINGLE-SHOT IMAGES; THREE-DIMENSIONAL MICROSCOPY;

INTERFEROMETRY;

EID: 14744306353     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.000695     Document Type: Article

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