Cross-sectional observation of yttrium and nickel oxide doped ceria powder

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 6, 2009, Pages 3898-3903

  Shih, Shao Ju ^a   Huang, Yizhorrg ^a   Lyu, Yang Ru ^b   Chen, Chin Yi ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Ceria; Focused ion beam; Selected area diffraction; Spray pyrolysis; Transmission electron microscopy

Indexed keywords

CERIA; CERIA POWDER; CROSS-SECTIONAL OBSERVATIONS; DOPED CERIA; FOCUSED ION BEAM TECHNIQUE; HOLLOW STRUCTURE; INNER SHELL; OUTER SHELLS; POWDER PARTICLES; SAMPLE PREPARATION METHODS; SELECTED AREA DIFFRACTION; SPHERICAL PARTICLE; SPHERICAL SHAPE; SPRAY PYROLYSIS METHOD;

BEAM PLASMA INTERACTIONS; CERIUM COMPOUNDS; DIFFRACTION; ELECTRON MICROSCOPES; ELECTRONS; FOCUSED ION BEAMS; ION BOMBARDMENT; IONS; NICKEL OXIDE; POWDERS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM; YTTRIUM OXIDE;

SPRAY PYROLYSIS;

EID: 67649230356     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.NS86     Document Type: Conference Paper

References (31)

1. T. V. Mani, H. K. Varma, A. D. Damodaran, and K. G. K. Warner, Ceram. Int. 19, 125 (1993).
2. N. Balagopal, K. G. K. Warrier, A. D. Damodaran, and K. S. Krishnan, J. Eur. Ceram. Soc. 12, 449 (1993).
3. S. Bernal, F. J. Botana, J. J. Calvino, G. A. Cifredo, J. A. Pi Srez-Omil, and J. M. Pintado, Catal. Today 23, 219 (1995).
4. L. F. Liotta, G. Pantaleo, A. Macaluso, G. Marci, S. Gialanella, and G. Deganello, J. Sol-Gel Sci. Technol. 28, 119 (2003).
5. H. Xu, L. Gao, H. Gu, J. Guo, and D. Yan, J. Am. Ceram. Soc. 85, 139 (2002).
6. T. C. Rojas and M. Ocana, Scripta Mater. 46, 655 (2002).
7. R. Marie, S. Ohara, T. Fukui, H. Yoshida, M. Nishimura, T. Inagaki, and K. Miurac, J. Electrochem. Soc. 146, 2006 (1999).
8. R. Marie, S. Seward, P. W. Faguy, and M. Oljaca, Electrochem. Solid St. 6, A91 (2003).
9. I. A. Castillo and R. J. Munz, Plasma Chem. Plasma P. 25, 87 (2005).
10. B. Skarman, D. Grandjean, R. E. Benfield, A. Hinz, A. Andersson, and L. R. Wallenberg, J. Catal. 211, 119 (2002).
11. N. Q. Minh, J. Am. Ceram. Soc. 76, 563 (1993).
12. T. Tago, S. Tashiro, Y. Hashimoto, K. Wakabayashi, and M. Kishida, J. Nanopart. Res. 5, 55 (2003).
13. C. Korsvik, S. Patil, S. Seal, and W. T. Self, Chem. Commun. 11, 1056 (2007).
14. G. L. Messing, S. C. Zhang, and G. V. Jayanthi, J. Am. Ceram. Soc. 76, 2707 (1993).
15. C. Y. Chen, T. K. Tseng, S. C. Tsai, C. K. Lin, and H. M. Lin, Ceram. Int. 34, 409 (2008).
16. L. Vergnieresa, P. Odierb, F. Weissa, C. E. Bruzekc, and J. M. Saugrain, J. Eur. Ceram. Soc. 25, 2951 (2005).
17. X. Zhang, S. Ohara, R. Marie, K. Mukai, T. Fukui, H. Yoshida, M. Nishimura, T. Inagaki, and K. Miura, J. Power Sources 83, 170 (1999).
18. D. J. Seo, K. O. Ryu, S. B. Park, K. Y. Kim, and R. H. Song, Mater. Res. Bull. 41, 359 (2006).
19. H. Schulz, W. J. Stark, M. Maciejewski, S. E. Pratsinisa, and A. Baiker, J. Mater. Chem. 13, 2979 (2003).
20. W. J. Stark, M. Maciejewski, L. Madler, S. E. Pratsinis, and A. Baiker, J. Catal. 220, 35 (2003).
21. Y. L. Song, S. C. Tsai, C. Y. Chen, T. K. Tseng, C. S. Tsai, J. W. Chen, and Y D. Yao, J. Am. Ceram. Soc. 87, 1864 (2004).
22. C. Ho, J. C. Yu, T. Kwong, A. Mak, and S. Lai, Chem. Mater. 17, 4514 (2005).
23. Y. Z. Huang, S. Lozano-PerezR. M. Langford, J. M. Titchmarsh, and M. L. Jenkins, J. Microsc-Oxford 207, 129 (2001).
24. L. A. Giannuzzi and F. A. Stevie, Micron 30, 197 (1999).
25. J. K. Lomness, L. A. Giannuzzi, and M. D. Hampton, Microsc. Microanal. 7, 418 (2001).
26. J. M. Cairney and P. R. Munroe, Mater. Charact. 46, 297 (2001).
27. M. Eslamian and N. J. Ashgriz, Eng. Mater. Technol. 129, 130 (2007).
28. M. L. Gupta and S. Singh, J. Am. Ceram. Soc. 53, 663 (1970).
29. C. J. Toussaint and G. Vos, J. Appl. Crystallogr. 1, 187 (1968).
30. S. Suda, M. Itagaki, E. Node, S. Takahashi, M. Kawano, H. Yoshida, and T. Inagaki, J. Eur. Ceram. Soc. 26, 593 (2006).
31. S. Suda, K. Kawahara, M. Kawano, H. Yoshida, and T. Inagaki, J. Am. Ceram. Soc. 90, 1094 (2007).