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Physica E: Low-Dimensional Systems and Nanostructures

Volumn 41, Issue 8, 2009, Pages 1539-1544

Electromagnetic characterization of carbon nanotube films by a two-point evanescent microwave method

(8) Kozlowski, G a,c Kleismit, R a Boeckl, J b Campbell, A b Munbodh, K a Hopkins, S c Koziol, K c Peterson, T b

a WRIGHT STATE UNIVERSITY (United States)

b AIR FORCE RESEARCH LABORATORY (United States)

c UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

Carbon nanotube film; Evanescent microwave microscopy; Permittivity

Indexed keywords

CARBON NANOTUBE FILM; CARBON NANOTUBE FILMS; CNT FILMS; COMPLEX PERMITTIVITY; ELECTROMAGNETIC CHARACTERIZATION; EVANESCENT MICROWAVE MICROSCOPY; EVANESCENT MICROWAVE PROBES; EVANESCENT MICROWAVES; EXPERIMENTAL DATA; FREQUENCY SHIFT; IMAGINARY PARTS; NEAR-FIELD MICROWAVE MICROSCOPES; QUALITY FACTORS; THEORETICAL MODELS; THERMAL DECOMPOSITIONS; TWO-POINT;

CARBON FILMS; MICROWAVES; PERMITTIVITY; PYROLYSIS; SILICON CARBIDE;

CARBON NANOTUBES;

EID: 67649213916 PISSN: 13869477 EISSN: None Source Type: Journal
DOI: 10.1016/j.physe.2009.04.034 Document Type: Article

Times cited : (5)

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