Growth and structural characterization of molecular superlattice of quaterrylene and N,N′-dioctyl-3,4,9,10-perylenedicarboximide

Organic Electronics

Volumn 10, Issue 5, 2009, Pages 1032-1036

  Hiroshiba, Nobuya ^a,b   Hayakawa, Ryoma ^a   Petit, Matthieu ^a   Chikyow, Toyohiro ^a   Matsuishi, Kiyoto ^b   Wakayama, Yutaka ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Organic semiconductor; Superlattice; Ultra slow deposition; X ray reflectometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; MOLECULES; SEMICONDUCTING ORGANIC COMPOUNDS; SUPERLATTICES; X RAYS;

ALTERNATE LAYERS; DEPOSITION TECHNIQUE; EQUILIBRIUM CONDITIONS; LAYER BY LAYER; STRUCTURAL CHARACTERIZATION; SUBSTRATE TEMPERATURE; X RAY REFLECTION; X-RAY REFLECTOMETRY;

FILM GROWTH;

EID: 67649210227     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2009.05.010     Document Type: Article

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