Early stage of growth of a perylene diimide derivative thin film growth on various Si(001) substrates

Journal of Physical Chemistry C

Volumn 111, Issue 34, 2007, Pages 12747-12751

  Petit, Matthieu ^a   Hayakawa, Ryoma ^a   Wakayama, Yutaka ^a   Chikyow, Toyohiro ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; FILM THICKNESS; GROWTH TEMPERATURE; SELF ASSEMBLED MONOLAYERS; SILICON; SUBSTRATES; X RAY DIFFRACTION;

KNUDSEN CELLS; STRANSKY-KRASTANOV GROWTH; X-RAY REFLECTIVITY;

THIN FILMS;

EID: 34548598446     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp071876w     Document Type: Article

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