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Volumn 8, Issue 5, 2007, Pages 631-634
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Growth of quaterrylene thin films on a silicon dioxide surface using vacuum deposition
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Author keywords
Atomic force microscopy; Crystal orientation; Grain size; Organic semiconductor; Thin film growth; X ray diffractometry
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL ORIENTATION;
GRAIN SIZE AND SHAPE;
SEMICONDUCTING ORGANIC COMPOUNDS;
SILICA;
X RAY DIFFRACTION ANALYSIS;
BRAGG REFLECTIONS;
MOLECULAR PLANES;
THIN FILM GROWTH;
FILM GROWTH;
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EID: 34548818486
PISSN: 15661199
EISSN: None
Source Type: Journal
DOI: 10.1016/j.orgel.2007.07.007 Document Type: Article |
Times cited : (15)
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References (12)
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