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Volumn 8, Issue 5, 2007, Pages 631-634

Growth of quaterrylene thin films on a silicon dioxide surface using vacuum deposition

Author keywords

Atomic force microscopy; Crystal orientation; Grain size; Organic semiconductor; Thin film growth; X ray diffractometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; GRAIN SIZE AND SHAPE; SEMICONDUCTING ORGANIC COMPOUNDS; SILICA; X RAY DIFFRACTION ANALYSIS;

EID: 34548818486     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2007.07.007     Document Type: Article
Times cited : (15)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.