High energy resolution hard x-ray and gamma-ray imagers using CdTe diode devices

IEEE Transactions on Nuclear Science

Volumn 56, Issue 3, 2009, Pages 777-782

  Watanabe, Shin ^a,b   Ishikawa, Shin Nosuke ^a,b   Aono, Hiroyuki ^a,b   Takeda, Shin'Ichiro ^a,b   Odaka, Hirokazu ^a,b   Kokubun, Motohide ^b   Takahashi, Tadayuki ^a,b   Nakazawa, Kazuhiro ^a   Tajima, Hiroyasu ^c   Onishi, Mitsunobu ^d   Kuroda, Yoshikatsu ^d  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d MITSUBISHI HEAVY INDUSTRIES LTD   (Japan)

Author keywords

CdTe detectors; CZT detectors; Gamma ray detectors; Imaging Spectrometers; Strip detectors

Indexed keywords

CDTE DETECTORS; CZT DETECTORS; GAMMA-RAY DETECTORS; IMAGING SPECTROMETERS; STRIP DETECTORS;

ALUMINA; ALUMINUM; ANALOG CIRCUITS; ANODES; APPLICATION SPECIFIC INTEGRATED CIRCUITS; CADMIUM ALLOYS; CADMIUM COMPOUNDS; DIODES; ELECTRIC POWER SUPPLIES TO APPARATUS; GAMMA RAYS; IMAGE SENSORS; METAL DETECTORS; PLATINUM; SEMICONDUCTOR DIODES; SPECTROMETERS; SPECTROMETRY; STARS; Z TRANSFORMS;

SEMICONDUCTOR DETECTORS;

EID: 67649161005     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2008806     Document Type: Article

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