SCOPUS 정보 검색 플랫폼

Volumn 22, Issue 4, 2009, Pages 395-404

Crystallographic and dielectric properties of highly oriented BaTiO 3 films: Influence of oxygen pressure utilized during pulsed laser deposition

(5) Hiltunen, J a,b Seneviratne, D a Tuller, H L a Lappalainen, J c Lantto, V c

a Massachusetts Institute of Technology (United States)

b VTT TECHNICAL RESEARCH CENTRE OF FINLAND (Finland)

c UNIVERSITY OF OULU (Finland)

Author keywords

BaTiO3; Phase transition; Strain; Stress; Thin film

Indexed keywords

BATIO3; BULK TRANSITION TEMPERATURE; DEPOSITION CONDITIONS; DIELECTRIC TUNING; FERROELECTRIC PHASE; HIGH ELECTRIC FIELDS; HIGHLY STRAINED; IN-PLANE; INFLUENCE OF OXYGEN; LOW PRESSURES; MGO SUBSTRATE; ORIENTED FILMS; OUT-OF-PLANE LATTICE PARAMETERS; OXYGEN PRESSURE; PARAELECTRIC PHASE; PERMITTIVITY VALUES; POLARIZATION DIRECTION; POLYCRYSTALLINITY; RELAXOR; ROOM TEMPERATURE; STRAIN ENGINEERING; TETRAGONAL DISTORTION; TUNABILITY; TUNING CURVE; WORKING PRESSURES;

BARIUM COMPOUNDS; CERAMIC CAPACITORS; CRYSTAL ORIENTATION; ELECTRIC FIELDS; EPITAXIAL FILMS; FERROELECTRIC FILMS; OSCILLATORS (ELECTRONIC); OXYGEN; PERMITTIVITY; POLARIZATION; PULSED LASER DEPOSITION; SINGLE CRYSTALS; THIN FILM DEVICES; TUNING;

PHASE TRANSITIONS;

EID: 67649124531 PISSN: 13853449 EISSN: 15738663 Source Type: Journal
DOI: 10.1007/s10832-008-9443-0 Document Type: Article

Times cited : (32)

References (34)

1
- 33748892269
- N. Setter D. Damjanovic L. Eng G. Fox S. Gevorgian S. Hong A. Kingon H. Kohlstedt N.Y. Park G.B. Stpehenson I. Stolitchnov A.K. Taganstev D.V. Taylor T. Yamada S. Streiffer 2006 J. Appl. Phys 100 051606
- (2006) J. Appl. Phys , vol.100 , pp. 051606
- Setter, N.¹ Damjanovic, D.² Eng, L.³ Fox, G.⁴ Gevorgian, S.⁵ Hong, S.⁶ Kingon, A.⁷ Kohlstedt, H.⁸ Park, N.Y.⁹ Stpehenson, G.B.¹⁰ Stolitchnov, I.¹¹ Taganstev, A.K.¹² Taylor, D.V.¹³ Yamada, T.¹⁴ Streiffer, S.¹⁵

2
- 0001477387
- Ch. Buchal L. Beckers A. Eckau J. Schubert W. Zander 1998 Mater. Sci. Eng B56 234
- (1998) Mater. Sci. Eng , vol.56 , pp. 234
- Buchal, Ch.¹ Beckers, L.² Eckau, A.³ Schubert, J.⁴ Zander, W.⁵

3
- 8344268623
- K.J. Choi M. Biegalski Y.L. Li A. Sharan J. Schubert R. Uecker P. Reiche Y.B. Chen X.Q. Pan V. Gopalan L.-Q. Chen D.G. Schlom C.B. Eom 2004 Science 306 1005
- (2004) Science , vol.306 , pp. 1005
- Choi, K.J.¹ Biegalski, M.² Li, Y.L.³ Sharan, A.⁴ Schubert, J.⁵ Uecker, R.⁶ Reiche, P.⁷ Chen, Y.B.⁸ Pan, X.Q.⁹ Gopalan, V.¹⁰ Chen, L.-Q.¹¹ Schlom, D.G.¹² Eom, C.B.¹³

4
- 29144531935
- O. Trithaveesak J. Schubert Ch. Buchal 2005 J. Appl. Phys 98 114101
- (2005) J. Appl. Phys , vol.98 , pp. 114101
- Trithaveesak, O.¹ Schubert, J.² Buchal, Ch.³

5
- 36449002511
- J.S. Speck A.C. Daykin A. Seifert A.E. Romanov W. Pompe 1995 J. Appl. Phys 78 1696
- (1995) J. Appl. Phys , vol.78 , pp. 1696
- Speck, J.S.¹ Daykin, A.C.² Seifert, A.³ Romanov, A.E.⁴ Pompe, W.⁵

6
- 4043117567
- J.H. Haeni P. Irvin W. Chang R. Uecker P. Reiche Y.L. Li S. Choudhury W. Tian M.E. Hawley B. Craigo A.K. Tagantsev X.Q. Pan S.K. Streiffer L.Q. Chen S.W. Kirchoefer J. Levy D.G. Schlom 2004 Nature 430 758
- (2004) Nature , vol.430 , pp. 758
- Haeni, J.H.¹ Irvin, P.² Chang, W.³ Uecker, R.⁴ Reiche, P.⁵ Li, Y.L.⁶ Choudhury, S.⁷ Tian, W.⁸ Hawley, M.E.⁹ Craigo, B.¹⁰ Tagantsev, A.K.¹¹ Pan, X.Q.¹² Streiffer, S.K.¹³ Chen, L.Q.¹⁴ Kirchoefer, S.W.¹⁵ Levy, J.¹⁶ Schlom, D.G.¹⁷

7
- 0003530309
- Oxford University Press New York
- M.E. Lines, A.M. Glass, Principles and Applications of Ferroelectrics and Related Materials, chap. 8 (Oxford University Press, New York, 1977)
- (1977) Principles and Applications of Ferroelectrics and Related Materials, Chap. 8
- Lines, M.E.¹ Glass, A.M.²

8
- 0003999843
- Academic London and New York
- B. Jaffe, W.R. Cook, H. Jaffe, Piezoelectric Ceramics (Academic, London and New York, 1971), p. 54
- (1971) Piezoelectric Ceramics , pp. 54
- Jaffe, B.¹ Cook, W.R.² Jaffe, H.³

9
- 10044240663
- F. Bai H. Zheng H. Cao L.E. Cross R. Ramesh J. Li D. Viehland 2004 Appl. Phys. Lett 85 4109
- (2004) Appl. Phys. Lett , vol.85 , pp. 4109
- Bai, F.¹ Zheng, H.² Cao, H.³ Cross, L.E.⁴ Ramesh, R.⁵ Li, J.⁶ Viehland, D.⁷

10
- 32944482029
- Y.L. Li L.Q. Chen 2006 Appl. Phys. Lett 88 072905
- (2006) Appl. Phys. Lett , vol.88 , pp. 072905
- Li, Y.L.¹ Chen, L.Q.²

11
- 0000482355
- Y. Yoneda T. Okabe K. Sakaue H. Terauchi H. Kasatani K. Degushi 1998 J. Appl. Phys 83 2458
- (1998) J. Appl. Phys , vol.83 , pp. 2458
- Yoneda, Y.¹ Okabe, T.² Sakaue, K.³ Terauchi, H.⁴ Kasatani, H.⁵ Degushi, K.⁶

12
- 33646126922
- F. He B.O. Wells 2006 Appl. Phys. Lett 88 152908
- (2006) Appl. Phys. Lett , vol.88 , pp. 152908
- He, F.¹ Wells, B.O.²

13
- 17644363688
- B.-K. Lai I.A. Kornev L. Bellaiche G.J. Salamo 2005 Appl. Phys. Lett 86 132904
- (2005) Appl. Phys. Lett , vol.86 , pp. 132904
- Lai, B.-K.¹ Kornev, I.A.² Bellaiche, L.³ Salamo, G.J.⁴

14
- 33744827440
- I.B. Misirlioglu S.P. Alpay F. He B.O. Wells 2006 J. Appl. Phys 99 104103
- (2006) J. Appl. Phys , vol.99 , pp. 104103
- Misirlioglu, I.B.¹ Alpay, S.P.² He, F.³ Wells, B.O.⁴

15
- 37649030857
- O. Diéguez S. Tinte A. Antons C. Bungaro J.B. Neaton K.M. Rabe D. Vanderbilt 2004 Phys. Rev. B 69 212101
- (2004) Phys. Rev. B , vol.69 , pp. 212101
- Diéguez, O.¹ Tinte, S.² Antons, A.³ Bungaro, C.⁴ Neaton, J.B.⁵ Rabe, K.M.⁶ Vanderbilt, D.⁷

16
- 11744388456
- N.A. Pertsev A.G. Zembilgotov A.K. Tagantsev 1998 Phys. Rev. Lett 80 1988
- (1998) Phys. Rev. Lett , vol.80 , pp. 1988
- Pertsev, N.A.¹ Zembilgotov, A.G.² Tagantsev, A.K.³

17
- 0028404315
- N.-M. Lee T. Sekine Y. Ito K. Uchino 1994 Jpn. J. Appl. Phys 33 1484
- (1994) Jpn. J. Appl. Phys , vol.33 , pp. 1484
- Lee, N.-M.¹ Sekine, T.² Ito, Y.³ Uchino, K.⁴

18
- 24644474706
- S.B. Mi C.L. Jia T. Heeg O. Trithaveesak J. Schubert K. Urban 2005 J. Cryst. Growth 283 425
- (2005) J. Cryst. Growth , vol.283 , pp. 425
- Mi, S.B.¹ Jia, C.L.² Heeg, T.³ Trithaveesak, O.⁴ Schubert, J.⁵ Urban, K.⁶

19
- 20444504738
- H.Z. Guo Z.H. Chen B.L. Cheng H.B. Lu L.F. Liu Y.L. Zhou 2005 J. Eur. Cer. Soc 25 2347
- (2005) J. Eur. Cer. Soc , vol.25 , pp. 2347
- Guo, H.Z.¹ Chen, Z.H.² Cheng, B.L.³ Lu, H.B.⁴ Liu, L.F.⁵ Zhou, Y.L.⁶

20
- 0030259649
- J. Zhang D. Cui Y. Zhou L. Li Z. Chen M. Szabadi P. Hess 1996 Thin Solid Films 287 101
- (1996) Thin Solid Films , vol.287 , pp. 101
- Zhang, J.¹ Cui, D.² Zhou, Y.³ Li, L.⁴ Chen, Z.⁵ Szabadi, M.⁶ Hess, P.⁷

21
- 0000589159
- E.J. Tarsa E.H. Hachfeld F.T. Quinlan J.S. Speck M. Eddy 1996 Appl. Phys. Lett 68 490
- (1996) Appl. Phys. Lett , vol.68 , pp. 490
- Tarsa, E.J.¹ Hachfeld, E.H.² Quinlan, F.T.³ Speck, J.S.⁴ Eddy, M.⁵

22
- 0000541018
- W.J. Kim W. Chang S.B. Qadri J.M. Pond S.W. Kirchoefer D.B. Chirsey J.S. Horwitz 2000 Appl. Phys. Lett 76 1185
- (2000) Appl. Phys. Lett , vol.76 , pp. 1185
- Kim, W.J.¹ Chang, W.² Qadri, S.B.³ Pond, J.M.⁴ Kirchoefer, S.W.⁵ Chirsey, D.B.⁶ Horwitz, J.S.⁷

23
- 33645520835
- J.A. Bellotti W. Chang S.B. Qadri S.W. Kirchoefer J.M. Pond 2006 Appl. Phys. Lett 88 012902
- (2006) Appl. Phys. Lett , vol.88 , pp. 012902
- Bellotti, J.A.¹ Chang, W.² Qadri, S.B.³ Kirchoefer, S.W.⁴ Pond, J.M.⁵

24
- 0001204715
- W.J. Kim H.D. Wu W. Chang S.B. Qadri J.M. Pond S.W. Kirchoefer D.B. Chirsey J.S. Horwitz 2000 J. Appl. Phys 88 5448
- (2000) J. Appl. Phys , vol.88 , pp. 5448
- Kim, W.J.¹ Wu, H.D.² Chang, W.³ Qadri, S.B.⁴ Pond, J.M.⁵ Kirchoefer, S.W.⁶ Chirsey, D.B.⁷ Horwitz, J.S.⁸

25
- 2342637220
- H.N. Al-Shareef D. Dimos M.V. Raymond R.W. Schwartz C.H. Mueller 1997 J. Electroceramics 1 145
- (1997) J. Electroceramics , vol.1 , pp. 145
- Al-Shareef, H.N.¹ Dimos, D.² Raymond, M.V.³ Schwartz, R.W.⁴ Mueller, C.H.⁵

26
- 33745451872
- J. Lappalainen V. Lantto J. Frantti J. Hiltunen 2006 Appl. Phys. Lett 88 252901
- (2006) Appl. Phys. Lett , vol.88 , pp. 252901
- Lappalainen, J.¹ Lantto, V.² Frantti, J.³ Hiltunen, J.⁴

27
- 0000138555
- L. Beckers J. Schubert W. Zander J. Ziesmann A. Eckau P. Leinenbach Ch. Buchal 1998 J. Appl. Phys 83 3305
- (1998) J. Appl. Phys , vol.83 , pp. 3305
- Beckers, L.¹ Schubert, J.² Zander, W.³ Ziesmann, J.⁴ Eckau, A.⁵ Leinenbach, P.⁶ Buchal, Ch.⁷

28
- 67649128426
- (Newton Square, PA)
- International Centre for Diffraction Data Powder Diffraction File Card No. 00-005-0626 (Newton Square, PA 1999)
- (1999) International Centre for Diffraction Data Powder Diffraction File Card No. 00-005-0626

29
- 21544473596
- V. Srikant E.J. Tarsa D.R. Clarke J.S. Speck 1995 J. Appl. Phys 77 1517
- (1995) J. Appl. Phys , vol.77 , pp. 1517
- Srikant, V.¹ Tarsa, E.J.² Clarke, D.R.³ Speck, J.S.⁴

30
- 0000553667
- M. Zgonik P. Bernasconi M. Duelli R. Schlesser P. Günter M.H. Garrett D. Rytz Y. Zhu X. Wu 1994 Phys. Rev. B 50 5941
- (1994) Phys. Rev. B , vol.50 , pp. 5941
- Zgonik, M.¹ Bernasconi, P.² Duelli, M.³ Schlesser, R.⁴ Günter, P.⁵ Garrett, M.H.⁶ Rytz, D.⁷ Zhu, Y.⁸ Wu, X.⁹

31
- 79956045865
- X. Zhu N. Chong H.L.-W. Chan C.-L. Choy K.-H. Wong Z. Liu N. Ming 2002 Appl. Phys. Lett 80 3376
- (2002) Appl. Phys. Lett , vol.80 , pp. 3376
- Zhu, X.¹ Chong, N.² Chan, H.L.-W.³ Choy, C.-L.⁴ Wong, K.-H.⁵ Liu, Z.⁶ Ming, N.⁷

32
- 31644451939
- S. Rios J.F. Scott A. Lookman J. McAneney J.M. Gregg 2006 J. Appl. Phys 99 024107
- (2006) J. Appl. Phys , vol.99 , pp. 024107
- Rios, S.¹ Scott, J.F.² Lookman, A.³ McAneney, J.⁴ Gregg, J.M.⁵

33
- 79956056195
- C.B. Parker J.-P. Maria A. Kingon 2002 Appl. Phys. Lett 81 340
- (2002) Appl. Phys. Lett , vol.81 , pp. 340
- Parker, C.B.¹ Maria, J.-P.² Kingon, A.³

34
- 41049095363
- M. Tyunina J. Levoska 2004 Phys. Rev. B 70 132105
- (2004) Phys. Rev. B , vol.70 , pp. 132105
- Tyunina, M.¹ Levoska, J.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.