Structural and optical characterization of epitaxial waveguiding BaTiO 3 thin films on MgO

Journal of Applied Physics

Volumn 83, Issue 6, 1998, Pages 3305-3310

  Beckers, L ^a   Schubert, J ^a   Zander, W ^a   Ziesmann, J ^a   Eckau, A ^a   Leinenbach, P ^a   Buchal, Ch ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000138555     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367099     Document Type: Article

References (23)

1. D. H. Lowndes, D. B. Geohegan, A. A. Puretzky, D. P. Norton, and C. M. Rouleau, Science 273, 898 (1996).
2. Y. Zhang, Y. Tavrin, H. J. Krause, H. Bousack, A. I. Braginski, U. Kalberkamp, U. Matzander, M. Burghoff, and L. Trahms, Appl. Suppercond. 3, 367 (1995).
3. J. Harada, in Landolt-Börnstein, Ferroelektrika und verwandte Substanzen, The New Series III 16 a (Springer, Berlin, 1981), p. 66 ff.
4. 3).
5. D. M. Gill, B. A. Block, C. W. Conrad, B. W. Wessels, and S. T. Ho, Appl. Phys. Lett. 69, 2968 (1996).
6. B. Stritzker, J. Schubert, U. Poppe, W. Zander, U. Krüger, A. Lubig, and Ch. Buchal, J. Less-Common Met. 164,165, 279 (1990).
7. Crystec GmbH, Köpenicker Str. 325, D-12555 Berlin, Germany.
8. F. J. Walker, R. A. McKee, H.-W. Yen, and D. E. Zelmon, Appl. Phys. Lett. 65, 1495 (1994).
9. L. C. Feldman, J. W. Mayer, and S. T. Picraux, Materials Analysis by Ion Channeling (Academic, New York, 1982).
10. J. P. Biersack and L. G. Haggmark, Nucl. Instrum. Methods 174, 257 (1980); "TRIM" is a computer code provided by these authors.
11. C. Scarfone, M. G. Norton, C. B. Carter, J. Li, and J. W. Mayer, Mater. Res. Soc. Symp. Proc. 201, 183 (1991).
12. J. Gong, M. Kawasaki, K. Fujito, U. Tanaka, N. Ishizawa, M. Yoshimoto, H. Koinuma, M. Kumagai, K. Hirai, and K. Horiguchi, Jpn. J. Appl. Phys., Part 1 32, L687 (1993).
13. V. Srikant, E. J. Tarsa, D. R. Clarke, and J. S. Speck, J. Appl. Phys. 77, 1517 (1995).
14. Y. Yoneda, H. Kasatani, H. Terauchi, Y. Yano, T. Terashima, and Y. Bando, J. Cryst. Growth 150, 1090 (1995).
15. H. F. Kay and P. Vousden, Philos. Mag. 40, 1019 (1949).
16. D. K. Fork, F. Armani-Leplingard, and J. J. Kingston, Mater. Res. Soc. Symp. Proc. 361, 155 (1994).
17. J. A. Hooton and W. J. Merz, Phys. Rev. 98, 409 (1955).
18. J. M. Marx, O. Eknoyan, H. F. Taylor, Z. Tang, and R. R. Neurgaonkar, Appl. Phys. Lett. 67, 1381 (1995).
19. R. Ulrich and R. Torge, Appl. Opt. 12, 2901 (1973).
20. D. H. Kim and H. S. Kwok, Appl. Phys. Lett. 67, 1803 (1995).
21. Ch. Buchal, Nucl. Instrum. Methods Phys. Res. B 96, 370 (1995);
22. Ch. Buchal, S. P. Withrow, C. W. White, and D. B. Poker, Annu. Rev. Mater. Sci. 24, 125 (1994).
23. O. Eknoyan, H. F. Taylor, Z. Tang, V. P. Swenson, and J. M. Marx, Appl. Phys. Lett. 60, 407 (1992).