Structural characterization of BaTiO3 thin films grown by molecular beam epitaxy

Journal of Applied Physics

Volumn 83, Issue 5, 1998, Pages 2458-2461

  Yoneda, Yasuhiro ^a,c   Okabe, Tooru ^a   Sakaue, Kiyoshi ^a   Terauchi, Hikaru ^a   Kasatani, Hirofumi ^b   Deguchi, Kiyoshi ^b  

^a KWANSEI GAKUIN UNIVERSITY   (Japan)

^b SHIZUOKA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000482355     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367006     Document Type: Article

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