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Applied Physics Letters

Volumn 94, Issue 23, 2009, Pages

Microwave properties of single-walled carbon nanotubes films below percolation threshold

(5) Darne, Chinmay a Xie, Leiming a Zagozdzon Wosik, Wanda a Schmidt, Howard K b Wosik, Jarek a

a University of Houston (United States)

b Rice University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAVITY PERTURBATION METHOD; COMPLEX PERMITTIVITY; DIELECTRIC CONSTANTS; DIELECTRIC RESONATOR TECHNIQUE; EFFECTIVE PERMITTIVITY; ELECTRICAL CONTACTS; INDUCED LOSS; MICROWAVE PROPERTY; PERCOLATION THRESHOLDS; QUALITY FACTORS; RESONANT FREQUENCIES; SINGLE-WALLED CARBON; SURFACTANT-STABILIZED;

CARBON FILMS; ELECTRIC FIELDS; ELECTRIC LOSSES; MAGNETIC FIELDS; MICROWAVE DEVICES; MICROWAVES; NATURAL FREQUENCIES; PERMITTIVITY; PERTURBATION TECHNIQUES; SINGLE-WALLED CARBON NANOTUBES (SWCN); SOLVENTS; SURFACE ACTIVE AGENTS;

CARBON NANOTUBES;

EID: 67649112188 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3153505 Document Type: Article

Times cited : (5)

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